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Author	SHA1	Message	Date
chn	3e853a0d99	add SiC/Deep learning inter-atomic potential for irradiation damage in 3C-SiC	2023-12-29 15:11:15 +08:00
chn	f26a0af003	add Review of Silicon Carbide Processing for Power MOSFET	2023-12-28 18:31:00 +08:00