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SiC-2nd-paper/paper/method/axis/default.typ

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== Definition of the axes
坐标轴的定义。
坐标轴在我们的研究中需要被明确定义,因为 4H-SiC 的各向异性,以及在不同文献中坐标轴的不同定义。
4H-SiC 晶体中存在镜面mirror plane和滑移面glide plane如图所示。
4H-SiC 的原子结构沿镜面反演后不变,但沿滑移面反演后还需要沿 z 轴平移半个晶格常数才能保持不变。
我们定义 x 轴平行于滑移面y 轴与 x 轴垂直并平行于一个镜面。
同时,我们定义 a 轴与 x 轴平行b 轴与 a 轴夹角为 120 度。
在此定义下,晶圆的切边沿 x 方向(即 [$11 overline(2) 0$] 方向),
台阶流外延过程中台阶台阶边沿平行于 y 方向(即 [$1 overline(1) 00$] 方向),生长方向为 x 方向(即 [$11 overline(2) 0$])。
此定义与 material projects 数据库以及大部分文献中的定义一致,而与其它一些文献中的定义不一致。
(最后一行补充参考文献)。
The axes in our study need to be clearly defined due to the anisotropy of 4H-SiC.
In the 4H-SiC crystal, there are three mirror planes and three glide planes, as shown in @figure-axis.
The atomic structure of 4H-SiC remains unchanged under reflection across a mirror plane,
but it requires a translation of $1/2c$ to remain unchanged under reflection across a glide plane.
We define the x-axis parallel to the glide plane,
and the y-axis perpendicular to the x-axis and parallel to a mirror plane.
Concurrently, we define the a-axis parallel to the x-axis,
and the b-axis at an angle of 120#sym.degree to the a-axis.
Under this definition, the wafer edge is along the x-axis (i.e. [$11 overline(2) 0$]),
the step edge during step-flow epitaxy is parallel to the y-axis (i.e. [$1 overline(1) 00$]),
and the growth direction is along the x-axis (i.e. [$11 overline(2) 0$]).
This definition is consistent with most literature and the Materials Project database,
while it differs from some other literature.
#include "fig-axis.typ"
依据此定义K在Gamma点的x方向M在Gamma点的y方向。应该也需要画个图