chn 6f371137b7

2025-08-23 20:30:11 +08:00

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4H-SiC辐照缺陷的低温光致发光光谱研究_王慧军.pdf

2025-06-19 09:00:22 +08:00

2021-Single-defect phonons imaged by electron microscopy.pdf

2025-06-22 16:45:09 +08:00

Formation and annealing of nitrogen-related complexes in SiC.pdf

2025-06-28 15:36:50 +08:00

Fröhlich modes in porous III-V semiconductors.pdf

2025-06-22 16:45:09 +08:00

Probing carrier concentration of doped GaN single crystals from LO phonon-plasmon coupled modes.pdf

2025-06-22 16:45:09 +08:00

Raman microscopy developments and applications.okular

2025-08-23 20:30:11 +08:00

SiC折射率.pdf

2025-08-23 14:13:08 +08:00

SiC折射率（紫外）.pdf

2025-08-23 14:13:08 +08:00