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@@ -8,16 +8,16 @@ The 4H-silicon carbide (SiC) has long attracted a lot of research
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It has been widely used in power electronic devices
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thanks to the development of epitaxy technology and the increasing application in the new energy industry
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@tsuchida_recent_2018 @harada_suppression_2022 @sun_selection_2022.
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However, the performance of 4H-SiC devices is still limited by the presence of defects,
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which can be introduced during the growth process @nishio_triangular_2020 @demenet_tem_2005
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and working conditions
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However, the performance of 4H-SiC devices remains constrained by the presence of defects,
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which may be introduced during the growth process @nishio_triangular_2020 @demenet_tem_2005
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or arise under device operating conditions
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@mahadik_ultraviolet_2012 @okada_dependences_2018 @iwahashi_extension_2017 @caldwell_driving_2010
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@miyanagi_annealing_2006 @iijima_correlation_2017.
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Moreover,
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characterization of the doping properties of SiC is usually performed by secondary ion mass spectrometry (SIMS)
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and Hall effect measurement,
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which are destructive and time-consuming,
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and non-destructive ad-hoc methods still need to be developed.
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Furthermore,
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conventional methods for characterizing the doping properties of SiC
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(such as secondary ion mass spectrometry (SIMS) and Hall effect measurements),
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are destructive and time-consuming.
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Therefore, there is a pressing need to develop non-destructive and efficient characterization techniques.
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// 声子(量子化的原子振动)在理解晶体的原子结构以及热电性质方面起着重要作用。
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// 声子可以通过多种实验技术来探测,包括 EELS、IR 吸收谱等。
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